Our Raman spectroscopy and near-infrared spectroscopy facilities

Materials and applications include 

Our Raman spectroscopy and NIRS instruments and techniques: an overview 

Scanning electron microscope (SEM) with correlative Raman – for chemical nanoanalysis

One of just a few chemical nanoanalysis setups of its kind in the UK, it delivers simultaneous composition analysis and high-resolution imaging. Ideal for: 

• Electrochemical materials, such as catalysts, electrodeposited thin films and battery electrodes
• Electronics, semiconductors, solid state, nanomaterials, nanoelectronics
• Polymers, which are otherwise challenging to image

Coherent Raman – for 3D imaging and dynamic systems

• Uses pulse lasers to naturally enhance the Raman signal, enabling characterisation and imaging at unrivalled speed and efficiency compared to other methods.
• Ability to image whole-system samples in 3D, such as physiological models of organic systems; video-rate chemical and molecular imaging to track dynamic processes in real time.
• Ideal for imaging and mapping cell culture samples, for product development or drug discovery, or fundamental research.
• The simplest and fastest combination of sub-micron (up to 200 nm) resolution and chemical information for materials innovation, nanoelectronics.

A range of conventional Raman spectrometers

• For laser excitations from 400 nm to 2.4 microns. 
• Reduces fluorescence to reveal otherwise hidden Raman signals. 
• Use of near infrared wavelengths is ideal for samples that are photosensitive, thermally sensitive or volatile. 

Absorption-based visible spectroscopy and near-infrared spectroscopy (NIRS)

• A trusted materials characterisation method with numerous industry applications.
• Deeper penetration than Raman and even more benign – therefore ideal for investigating art or heritage samples.
• Characterisation of formulations, paints, solutions and mixtures

Our Raman, NIRS and spectroscopy instruments: technical specifications

Chemical nanoanalysis scanning electron microscope

Zeiss Sigma 500 VP FESEM

• Field emission source – 20 nA configuration
• Resolution: 0.8 nm at 15 kV, 1.4 nm at 1 kV
• Imaging detectors: SE2, AsB, InLensDuo SE & BSE (energy selective), C2D for VP mode, SCD (specimen current detector)
• 80 mm air-lock for sample transfer
• XEI Evactron E50 Plasma Cleaner
• SemiLab air-sensitive sample shuttle

Oxford Instruments dual-EDS

• WITec RISE – correlative Raman
• Ultim X-Max 170 mm2
• Ultim Extreme 100 mm2 windowless
• Sub 10 nm mapping possible
• Mapping at <5 kV possible
• Aztek Advanced Software
• LayerProbe for thin film analysis (layer thickness and composition correction)

WITec RISE – Correlative Raman

• 532 nm laser diode / 32 mW
• 100x objective 0.75 NA
• 600 & 1800 gratings
• ~432 nm spot size
• Scanning/mapping done by piezo-stage objective
• Acquisition modes: point spectrum, line scan, mapping (area, depth and 3D)
• Data processing with Project Six

Raman microscopy 

Renishaw inVia Confocal Raman microscope with 785 nm laser

• 785 nm laser source at 50 mW max power output
• Line focus profile at ~20×5 µm spot size
• 1200 gr/mm grating
• Automated stage for line scans or mapping.
• X5, X50 LWD and X50 0.9NA objectives

Coherent Raman microscope with Airyscan on LSM980 confocal

• Tuneable pulsed (2 ps, 80 MHz) laser from 700 nm to 1 μm
• Standard 405 nm, 488 nm, 561 nm and 639 nm lasers
• X10, X20, X40 (1 NA) and X63 (1.4 NA) objectives
• Airyscan module for resolution enhancement